Abstract
An analytical method for transient dynamics description in microresonators is used to characterize and visualize the transient effects. In the frame of this method, the pulsed complex source point concept is used to simulate an incident transient beam. The excited fields in the microcavity are described by means of a rigorous mathematical approach that is based on the analytical solution in the Laplace transform domain and accurate evaluation of residues at singular points corresponding to the excited modes. The effects of transient mode beating and ultrashort pulse splitting inside the microresonator for short pulse excitation are discussed.
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