Abstract
In the present era, down scaling of complementary metal-oxide-semiconductor (CMOS) technology has lead the metal-oxide-semiconductor field-effect-transistor's (MOSFET) sizes to nanometer regime which in turn experiencing difficulties due to the effect of physical and technological perspective. Double-gate (DG) MOSFET is considered as a promising device to reduce the shortcoming and shrink down towards nanometer domain. This paper proposes electrostatic potential distribution and drain current models for the lightly doped symmetrical p-channel DG MOSFET. The analytic solution of potential distribution is derived by solving the 2D Poisson's equation incorporated with hole density through the superposition method. The drain current model has been explored by incorporating physical effects like threshold-voltage roll-off, channel length modulation and surface roughness scattering. Functionality of the models has been calculated in MATLAB and the obtained results are verified and compared with state of the art literature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Periodica Polytechnica Electrical Engineering and Computer Science
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.