Abstract
In this paper, the modeling of microstrip line gap discontinuity on multilayer semiconductor substrate is presented. The reflection coefficient and transmission coefficient are computed from the equivalent lumped circuit model of microstrip line gap discontinuity. The lumped circuit elements- capacitance, inductance and resistance are calculated using closed-form expressions in term of the gap discontinuity, width of microstrip line and dielectric substrate thickness. Static Spectral Domain Analysis (SDA) method is used to compute characteristic impedance of microstrip line.
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