Abstract
The amplifier is a key component of the radio frequency (RF) front-end, and its specifications directly determine the performance of the system in which it is located. Unfortunately, amplifiers’ specifications degrade with temperature and even lead to system failure. To study how the system failure is affected by the amplifier specification degradation, it is necessary to couple the amplifier specification degradation into the system optimization design. Furthermore, to couple the amplifier specification degradation into the optimal design of the system, it is necessary to model the characteristics of the amplifier specification change with temperature. In this paper, the temperature characteristics of two amplifiers are modeled using an extreme learning machine (ELM), and the results show that the model agrees well with the measurement results and can effectively reduce measurement time and cost.
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