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Open Accesshttps://doi.org/10.1109/tia.2023.3296388
Copy DOI Publication Date: Nov 1, 2023 | |
 Citations: 1 |  License type: cc-by |
Affiliation: Kiel University, Maschinenfabrik Reinhausen (Germany)Modeling of Asymmetrical Grid Faults for P-HIL Accuracy and Stability Analysis in LVRT Tests
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