Abstract
AFM has some unique properties such as higher spatial resolution, mapping even a single molecule, simple sample preparation, scanning in different types of medium, and can obtain a 3D scan of the sample surface. Therefore, with the help of AFM, one can obtain a unique understanding of the structure and functional behavior of materials. In this article, to construct the mathematical model of the base excited AFM cantilever mass spring system (lumped parameter model) is used and the solution obtained by the method of Multiple scales. Here, in this work, we consider the AFM operates in the non-contact mode. To study the effect of the non linearity, amplitude of excitation, and damping coefficient, frequency response equation obtained.
Highlights
Atomic force microscope (AFM) which is a nanoscale prober was invented in 1986 [1] and serves to investigate nanoscale surfaces
By AFM one can obtain a 3D scan of the sample surface
With the help of AFM, one can obtain a unique understanding of the structure and functional behavior of materials [2, 3]
Summary
Atomic force microscope (AFM) which is a nanoscale prober was invented in 1986 [1] and serves to investigate nanoscale surfaces. AFM in contrast with other types of microscopes utilizes a sharp nanoscale tip instead of a light or electron beam. AFM can discover/find changes at a spatial resolution of up to a million X because of the sharp nanoscale tip. In comparison with other types of conventional microscopes has some unique properties such as higher spatial resolution, mapping even a single molecule, simple sample preparation, scanning in different types of medium (for example in liquids). By AFM one can obtain a 3D scan of the sample surface. With the help of AFM, one can obtain a unique understanding of the structure and functional behavior of materials [2, 3]
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