Abstract
As embedded memory area on-chip is increasing and memory density is growing, problem of faults is growing exponentially. Newer test algorithms are developed for detecting these new faults. These new March algorithms have much more number of operations than the March algorithms existing earlier. An architecture implementing these new algorithms is presented here. This is illustrated by implementing the newly defined March SS algorithm. Along with the fault diagnosis a word-oriented memory Built-in Self Repair methodology, which supports on-the-fly memory repair, is employed to repair the faulty locations indicated by the MBIST controller presented.
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