Abstract
This article first develops a radiated electromagnetic interference (EMI) model for a gallium nitride (GaN) integrated circuit (IC)-based active clamp flyback converter. Important capacitive couplings, which play a big role in the radiated EMI, are identified, extracted, and validated in the converter. The radiated EMI model is improved to characterize the impact of capacitive couplings. Based on the improved model, techniques to reduce capacitive couplings and the radiated EMI are proposed and experimentally validated.
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