Abstract
Galvanometers are ubiquitous in point-scanning applications in optical imaging, display, ranging, manufacturing, and therapeutic technologies. However, galvanometer performance is constrained by finite response times related to mirror size and material properties. We present a model-driven approach for optimizing galvanometer response characteristics by tuning the parameters of the closed-loop galvanometer controller and demonstrate settling time reduction by over 50%. As an imaging proof-of-concept, we implement scan waveforms that take advantage of the optimized galvanometer frequency response to increase linear field-of-view, signal-to-noise ratio, contrast-to-noise ratio, and speed. The hardware methods presented may be directly implemented on galvanometer controllers without the need for specialized equipment and used in conjunction with customized scan waveforms to further optimize scanning performance.
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