Abstract
This paper presents a theoretical study on the threshold defect tolerance level. A new defect level model is proposed and used as a basis for the study in order to facilitate a theoretical modeling and evaluation of defect tolerance under a circumstance in which conventional testing processes are not practically viable. A comprehensive and thorough defect classification and characterization is conducted under specific design constraint when traditional testing is not practically deployable. An approach to an extensive theoretical and parametric compilation and optimization will be introduced in order to reveal a theoretical threshold defect tolerance level at which each choice defect tolerance method and strategy can be justified. The simulation results reveal there exists a theoretical threshold of defect tolerance level that will help guide the test and defect tolerance engineers to identify the optimal and viable testing and defect tolerance level.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
