Abstract
PurposeIn eddy current nondestructive testing, ferrite-cored probes are usually used to detect and locate defects such as cracks and corrosion in conductive materials. However, the generic analytical model for evaluating corrosion in layered conductor using ferrite-cored probe has not yet been developed. The purpose of this paper is to propose and verify the analytical model of an E-cored probe for evaluating corrosion in layered conductive materials.Design/methodology/approachA cylindrical coordinate system is adopted and the solution domain is truncated in the radial direction. The magnetic vector potential of each region excited by a filamentary coil is derived first, and then the expansion coefficients of the solution are obtained by matching the boundary and interface conditions between the regions and the subregions. Finally the closed-form expression of the impedance of the multi-turn coil is derived by using the truncated region eigenfunction expansion (TREE) method, and the impedance calculation is carried out in Mathematica. In the frequency range of 100 Hz to 10 kHz, the impedance changes of the E-cored coil and air-cored coil due to the layered conductor containing corrosion are calculated, respectively, and the influences of corrosion on the coil impedance change are investigated.FindingsAn analytical model for the detection and evaluating of corrosion in layered conductive materials using E-cored probe is proposed. The model can quickly and accurately calculate the impedance change of E-cored coil due to corrosion in layered conductor. The correctness of the analytical model is verified by finite element method and experiments.Originality/valueAn accurate theoretical model of E-cored probe for evaluating corrosion of multilayer conductor is presented. The analytical model can be used to detect the inhomogeneity of layered conductor, design ferrite-cored probe or directly evaluate the corrosion defects of layered conductors.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
