Abstract
This paper presents a feasibility study of imaging defects in dielectric materials using principles of time reversal with microwaves. The principle is demonstrated using a two‐dimensional finite difference time domain model for simulating the propagation of forward and time reversed wave fields. The scattered electric field is recorded on a linear array of receivers; time reversed and propagated backwards using the model to highlight the scatterer/defect. Simulations results validating the approach are presented. Initial results demonstrate the ability of the technique to image defects.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have