Abstract

This paper presents a feasibility study of imaging defects in dielectric materials using principles of time reversal with microwaves. The principle is demonstrated using a two‐dimensional finite difference time domain model for simulating the propagation of forward and time reversed wave fields. The scattered electric field is recorded on a linear array of receivers; time reversed and propagated backwards using the model to highlight the scatterer/defect. Simulations results validating the approach are presented. Initial results demonstrate the ability of the technique to image defects.

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