Abstract
AbstractA procedure for the recognition of undesired solid deposition on the optical element of an attenuated total reflectance probe for online mid‐infrared spectroscopy during crystallization processes is presented. Unlike other approaches, the method exclusively uses intelligent spectral analysis for solid recognition and does not require additional devices. Indirect hard modeling enables the separation of the solid material's contribution to the mixture spectra from those contributions of the dissolved material and the solvents, expressed through the predicted component weights. The detection of the solid component weight is promising for implementation into process monitoring or control.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
