Abstract
AbstractThin films of yttria stabilized zirconia (YSZ) were deposited by metal organic chemical vapor deposition (MOCVD) on cobalt-chromium (Co-Cr) alloys used for orthopaedic implants. TMHD derivatives were preferred for the metalorganic sources over the less expensive fluorinated beta-diketonates as the latter left up to 1% fluorine in the film, as determined by Auger spectroscopy. Crystalline cubic structure of these YSZ films was verified by X-ray diffraction. Columnar grain growth gave a rough surface on thicker YSZ films, which increased wear of the mating polyethylene component during simulation tests. YSZ films under one micron thick were mirror smooth and reduced wear of the polymer component by 70% compared to uncoated Co-Cr. Film adhesion was excellent.
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