Abstract
Air-stable organic field-effect transistors (FETs) based on an unsubstituted polythiophene (PT) channel, processed using oxidative chemical vapor deposition (oCVD), have been investigated. The intrinsic properties of PT, including its rigid backbone structure and resistance to reactions with water and oxygen, lead to excellent air stability of oCVD PT-based FET devices. The effect of the channel/metalization contact resistance on the field-effect mobility (μFE) of PT-based FETs has also been investigated. Due to the channel/metallization contact resistance, the actual voltages applied to the channel are found to be significantly lower than the intended drain bias because of the voltage drops that occur at the source/drain contacts. Transmission-line measurements reveal that more than 30% of the intended drain bias is lost at all gate voltages applied to the channel. Reconstructed output characteristics excluding the contact effect allow the extraction of a corrected μFE, which is approximately 40% higher than that with contact resistance.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
