Abstract
Single devices including both analog and digital functions are now a practical possibility, but testing remains a problem and a bar to widespread use. Possible approaches to design using current monitoring are reviewed. The implications of these approaches for switched current devices are investigated, with emphasis on current monitoring. Simulation results show that high levels of fault coverage are possible using current monitoring. Natural processing of current mode signals in a discrete time environment lends itself to the possibility of on-chip reconfigurable self-test and test pattern generation. >
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