Mitigation of Soft Error Rate using Design, Process and Material Improvements

Abstract

To meet specific product and field application needs, customers frequently ask the product's design teams and semiconductor foundries for more stringent Soft Error Rate (SER) radiation reliability requirements. These stretched product applications' needs call for special mitigation techniques and improvements to achieve robustness on SER by product design, process improvements and material changes to meet the requirements. In some cases even the combination of the design, process and material improvements are needed to achieve the stringent targets on product's SER. This paper presents some of the SER mitigation techniques by design, process and material improvements that are used to achieve the stringent SER targets along with the experiments and their results.