Abstract
In 2000, Balamurali and Govindaraju presented the modified tightened two-level continuous sampling plan (modified MLP-T-2 plan). This paper explores the problem of minimizing the average fraction inspected (AFI) for a modified MLP-T-2 plan. The solution procedure is developed to find the optimal parameters that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the AFI for the modified MLP-T-2 plan when the process average (average p)(＞AOQL) is known.
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