Abstract
A method that uses the minimal spanning tree graph was previously developed (C. Dussert, G. Rasigni, M. Rasigni, J. Palmari and A. Llebaria, Phys. Rev. B, 34 (1986) 3528) in order to analyse the degree of order in aggregated thin films. This graph is shown to be very powerful in bringing out directional properties in the nucleation of thin films which cannot be revealed by a simple visual examination. The method is illustrated by means of various computer simulations.
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