Abstract
An infrared imaging system has been developed for measuring the temperature increase during the dynamic deformation of materials. The system consists of an 8×8 HgCdTe focal plane array, each with its own preamplifier. Outputs from the 64 detector/preamplifiers are digitized using a row-parallel scheme. In this approach, all 64 signals are simultaneously acquired and held using a bank of track and hold amplifiers. An array of eight 8:1 multiplexers then routes the signals to eight 10 MHz digitizers, acquiring data from each row of detectors in parallel. The maximum rate is one million frames per second. A fully reflective lens system was developed, consisting of two Schwarszchild objectives operating at infinite conjugation ratio. The ratio of the focal lengths of the objectives determines the lens magnification. The system has been used to image the distribution of temperature rise near the tip of a notch in a high strength steel sample (C-300) subjected to impact loading by a drop weight testing machine. The results show temperature rises at the crack tip up to around 70 K. Localization of temperature, and hence, of deformation into “U” shaped zones emanating from the notch tip is clearly seen, as is the onset of crack propagation.
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