Millimeter-Wave Built-In Test Concepts

Abstract

This chapter is dedicated to the realization of integrated test concepts in the millimeter-wave range. The general architecture of a direct integrated test concept is presented. Different approaches in the analog, mixed-signal, and RF domain are outlined. In the following, possibilities for a test signal generation, e.g. single-tone, Y-factor, and loopback test are discussed regarding their performance parameter determination capabilities. Furthermore, an overview of the functionality, usability, and characterization of IQ-modulators for the generation of single-sideband test signals is given. The end of the chapter covers the injection of the test signal into the receiver path via directional couplers and gives an overview of implementation and working principle of power detectors for the determination of the test signal strength.