Abstract
The beam profile of a millimeter wave radiated from the tip of a Teflon dielectric probe was characterized experimentally by using a three-dimensional scanning dielectric probe and numerically by using the finite difference time domain (FDTD) method. The measured intensity distribution and polarization of the millimeter wave radiated from the tip of the probe was in good agreement with those of the FDTD simulation. A reflection type of a millimeter- wave imaging system using this dielectric probe was constructed. The resolution of the imaging system was as small as 1 mm, which was slightly smaller than a half wavelength, 1.6 mm, of the radiation wave. Translucent measurement of a commercially manufactured IC card which consists of an IC chip and a leaf-shaped antenna coil was demonstrated. Not only the internal two-dimensional structures but also the vertical information of the card could be provided.
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