Abstract

This paper presents a method for measuring the thicknesses of dielectric materials using microwave and millimeter-wave time domain reflectometry (TDR) techniques. Reflection coefficient in the frequency domain measurements was performed on rectangular G10 dielectric slabs using a Ka-band (26.5 – 40 GHz) open-ended rectangular waveguide and a vector network analyzer. To predict the behavior of the measurements, the experiment was 3D modeled and simulated using CST Studio Suite®, an electromagnetic numerical simulation package. The frequency domain measurements were then converted to time domain using an inverse Fourier transform. The thicknesses of the G10 slabs were then extracted from the time domain amplitude vs. distance curves. Based on this comparison between the actual thickness measurements obtained using a Vernier caliper and the TDR results, the thickness error was calculated to be less than 9% for G10 slab thicknesses ranging from 5 mm to 19 mm.

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