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Abstract
One century after Mie's original paper, Mie scattering is still a fertile field of scientific endeavor. We show that the Mie scattering distinguishes the topological charge of light beams with phase dislocations. We experimentally and numerically study the scattering of highly focused Laguerre–Gaussian beams by dielectric and metal spheres, and show that the scattered field is sensitive to the modulus and to the sign of the topological charge. The implications for position detection systems are also discussed.
Highlights
One century after Mie’s original paper, Mie scattering is still a fertile field of scientific endeavor
We address the question whether the analysis of the scattered field would enable us to distinguish the sign of the phase dislocation, as one would expect based on the arguments given above
A LG beam was generated by converting the Gaussian beam coming from a fiber laser (λ = 1064 nm, linearly polarized) using diffractive optical elements (DOEs) implemented on a spatial light modulator (SLM) (Hamamatsu) [31]
Summary
One century after Mie’s original paper, Mie scattering is still a fertile field of scientific endeavor. We show that the Mie scattering distinguishes the topological charge of light beams with phase dislocations. We experimentally and numerically study the scattering of highly focused Laguerre–Gaussian beams by dielectric and metal spheres, and show that the scattered field is sensitive to the modulus and to the sign of the topological charge. We address the question whether the analysis of the scattered field (i.e. without observing the movement of an optically trapped particle due to the transfer of angular momentum) would enable us to distinguish the sign of the phase dislocation, as one would expect based on the arguments given above. A position detector, located at a plane conjugated to the back-focal plane of the condenser lens, is used to quantify the variations in the total scattered field.
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