Abstract

A method for microwave measurement of the reflector antenna surface profile is described. The technique uses a focused monostatic secondary reflector located on axis at approximately two focal lenths from the reflector under test. Measurement of the two-ways phase change provides profile error information over a set of annular sections. Practical results are provided to illustrate the spatial resolution and sensitivity of the technique.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call