Abstract
We report microwave surface resistance R s ( T) measurements on Lu 1− x Pr x Ba 2Cu 3O 7−δ thin films in situ grown by Pulsed Laser Deposition (PLD) technique, focussing on the effect of Pr doping in this system. Anomalous peaks in R S ( T) plots are observed for both dilute and strong doping concentrations of Pr ( x ∼ 0.07 and x ∼ 0.2). Also ageing effects are observed in these films, with a decrease in residual surface resistance and vanishing of the peaks with ageing of these films. We interpret the peaks in R S ( T) vs T curve due to the different competing processes involving the temperature dependences of quasi particle scattering time, pair condensation, penetration depth and percolation effects.
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