Microwave magnetoresistance and electron spin resonance in Ge:Mn thin films and nanowires

Abstract

Resonant and nonresonant absorption of microwave radiation is found to occur in germanium films implanted with manganese at concentrations of 2, 4, and 8 at %. Electron spin resonance is observed in two temperature ranges: (i) in the vicinity of the phase transition of Mn5Ge3 clusters to the ferromagnetic state at T = 295 K; and (ii) in the range of temperatures below 60 K, at which collective ordering of Mn spins in the crystal lattice and spin-wave resonance take place. The dependence of the nonresonant signal of the microwave magnetoresistance on the magnetic field exhibits a nonmonotonic behavior identical for the X and K microwave bands. An analysis of the field dependence of the microwave magnetoresistance makes it possible to separate two components of the derivative of the magnetoresistance: the quasi-linear Lorentzian component observed in strong fields and the negative exponential anisotropic component determined by spin-dependent scattering of charge carriers from magnetic impurities. The length of the phase relaxation of charge carriers is estimated to be 350 nm at T = 2 K and exceeds the thickness of the film (120 nm) and the sizes of clusters and precipitates (3–5 nm). In quasi-one-dimensional nanowires of the composition Ge:Mn at the same impurity concentrations, microwave magnetoresistance is absent. These facts suggest that conduction in thin films has a quasi-two-dimensional character and that the measured microwave magnetoresistance is associated with charge carriers in the crystal lattice rather than with impurity clusters.