Abstract
We recently reported a method for measuring the microwave surface resistance(Rs) of large-area HTS films. The device was formed from a sapphire quasi-opticaldielectric resonator (QDR) with conducting end-plates (CEP). In the present work,Rs-measurement procedures and data obtained under different conditionsare systematically analysed. The accuracy and the sensitivity of theRs-measurement are analysed. The results of the study clearly demonstrate that the proposedtechnique provides a sensitivity which is increased by at least one order in comparison withthe most accurate cavity resonator techniques in the millimetre wave range. In addition,the first experimental results on the temperature dependence of the QDR resonances withdifferent CEP (HTS and/or Cu) are discussed in terms of a surface reactance(Xs) measurement.
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