Abstract
Two- and three-dimensional (2D and 3D) atom localization is analyzed by monitoring the probe absorption spectrum in a microwave driven X-type scheme. It is found that for both stationary and moving atom cases, the precision and certainty in atomic position can be significantly improved by proper adjustment of the system parameters. Our results also reveal that the high microwave field strength curbs the Doppler broadening effect to a large extent and enhances detection probability to 100% in 2D and 3D subspace at nonzero temperatures. Our proposed scheme may be helpful for experimental realization of high precision position measurement and atom nanolithography at room temperature.
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