Abstract
The La5CrTi3O15 and La4MCrTi3O15 (M=Pr, Nd, and Sm) microwave dielectric ceramics were prepared by the conventional solid‐state ceramic route. The structure and microstructure of the ceramics were studied by X‐ray diffraction and scanning electron microscopy methods. The dielectric properties of the ceramics were measured in the microwave frequency region using a network analyzer by the resonance method. The ceramics show a dielectric constant (ɛr) in the range of 37 to 39.5, a quality factor (Qu×fo) 17,300 to 34,000 GHz, and a temperature coefficient of resonant frequency (τf) in the range from −22 to −38 ppm/°C.
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