Abstract
This study elucidates the microwave dielectric properties and microstructures of Nd(Mg0.5−xCoxSn0.5)O3 ceramics with a view to their potential for microwave devices. The Nd(Mg0.5−xCoxSn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the Nd(Mg0.45Co0.05Sn0.5)O3 ceramics revealed no significant variation of phase with sintering temperatures. A dielectric constant (ɛ r ) of 19.2, a quality factor (Q × f) of 68,900 GHz, and a temperature coefficient of resonant frequency (τ f ) of −67 ppm/°C were obtained for Nd(Mg0.45Co0.05Sn0.5)O3 ceramics that were sintered at 1,550 °C for 4 h.
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