Microwave dielectric characteristics and finite element analysis of MgTiO 3–CaTiO 3 layered dielectric resonators

Abstract

MgTiO 3 and CaTiO 3 ceramics were stacked in different schemes to yield the layered dielectric resonators, and the microwave dielectric characteristics were evaluated with TE 0 1 1 resonant mode. With increasing the thickness fraction of CaTiO 3, the measured resonant frequency and Q f value decreased, while the effective dielectric constant and temperature coefficient of resonant frequency increased. The stacking scheme also had significant effect on the microwave dielectric properties. Finite element method was used to predict the microwave dielectric characteristics of the layered dielectric resonators, and the predicted results indicated good agreements with the experimental ones. The temperature-stable resonators could be attained by adjusting the thickness fractions of CaTiO 3 since MgTiO 3 and CaTiO 3 had reverse temperature coefficients of resonant frequency.