Abstract
By studying the optical microwave frequency response of a microcavity quantum-well vertical cavity surface-emitting laser (VCSEL) in the transition, over a low (a spread-out) mode density, from spontaneous to coherent operation, we resolve the dynamics (spontaneous to stimulated) of electron-hole recombination and reveal the existence of “fast” spontaneous recombination (τBspon<159 ps) in a carrier population generally characterized by a large average lifetime of ∼1 ns (Δn/τav=Δn1/τfast+(Δn−Δn1)/τslow,τfast<τslow). The measured average spontaneous lifetime is not a constant but is altered by the device size, geometry, and boundary conditions (e. g., cavity and current input-output boundary conditions).
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