Abstract
Techniques measuring photoconductive decay by means of microwaves (μ-PCD) can be used to detect free carriers in semiconductors. The instrument as developed at ECN for characterization of the solar cell material is described. The experimental details of two measurement techniques and the theoretical background are discussed. In the decay method the effective mean lifetime of the minority carriers is measured. In the harmonic modulation technique information about the lifetime of the minorities is contained in the phase-shift of the microwave signal relative to the phase of the light intensity. The aim of this research is to determine the bulk mean lifetime of the minority carriers and the surface recombination velocities of solar cell silicon wafers by a non-destructive and contactless technique. Typical experiments will be presented.
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