Microwave Coincidence Imaging Based on Attributed Scattering Model

Abstract

In this letter, a novel microwave coincidence imaging (MCI) method based on the attributed scattering model (ASM) is proposed. Unlike the classical MCI model which assumes the target as a set of discrete scatterers, the ASM-based MCI equation contains three kinds of reference matrices corresponding to the point-scatterers (PSs), the line-segment-scatterers (LSSs) and the rectangular-plate-scatterers (RPSs), respectively. Hence the ASM-based MCI could resolve richer information about the object geometries. By solving the imaging equation via the alternating direction method of multipliers (ADMM) algorithm, the scattering coefficients will be obtained and the target can be reconstructed according to the presetting parameter sets. Meantime, the ASM-based MCI also earns the superresolution ability like the classical MCI, which is brought in by the temporal-spatial orthogonal radiation field. Simulations and experiment are carried out to demonstrate the performance and superresolution ability of proposed method. The ASM-based MCI makes contributions to the progress of radar forward-looking imaging theory and technology.