Abstract
In order to assist the microwave engineer in predicting the performance of partially magnetized devices, we have characterized the microwave permeability of partially magnetized materials. The real part of the tensor permeability elements, /spl mu/, /spl kappa/, and /spl mu//sub z/, depends primarily on the parameters /spl gamma/4/spl pi/M//spl omega/ and /spl gamma/4/spl pi/M/sub s/ / /spl omega/. Empirical formulas have been developed which show the dependence. At frequencies sufficiently below /spl omega/ = /spl pi/4/spl pi/M/sub s/, the loss can be characterized by the value of /spl mu/'' at 4/spl pi/M = 0./spl mu/, /spl kappa/, and /spl mu//sub z/ depend weakly on composition, whereas /spl mu/'' (4/spl pi/M = 0) does depend upon the chemical composition.
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