Microwave absorption properties of single and double-layer absorbers based on BaFe12O19 and SiO2

Abstract

In order to study a new microwave absorption properties of single and double layer barium hexaferrite and silica have been investigated in X-band (8.2–12.4 GHz) frequencies. Barium hexaferrite BaFe12O19 was synthesized by ceramic method and Silica SiO2 was prepared from beach sand. Barium hexaferrite and silica SiO2 with a total thickness of 3 mm, 4 mm, 5 mm, 6 mm and 7 mm, were characterized at room temperature using vector network analyser (VNA) Keysight PNA-L N5232A. Reflection loss (RL) of single and double-layer absorbers of barium hexaferrite and silica were calculated and simulated using the transmit line theory. The minimum RL value (less than − 10 dB) of single layer barium hexaferrite is −21 dB at 9 GHz. The minimum RL values (less than − 10 dB) of single layer silica SiO2 is −40 dB at 9.2 GHz with 4 mm of thickness. The results show that double layer absorbing material showed different RL values than single layer of barium hexaferrite BaFe12O19 and silica SiO2.