Abstract

The microwave absorption properties of Ni/(C, silicides) nanocapsules prepared by an arc discharge method have been studied. The composition and the microstructure of the Ni/(C, silicides) nanocapsules were determined by means of X-ray diffraction, X-ray photoelectric spectroscopy, and transmission electron microscope observations. Silicides, in the forms of SiOx and SiC, mainly exist in the shells of the nanocapsules and result in a large amount of defects at the ‘core/shell’ interfaces as well as in the shells. The complex permittivity and microwave absorption properties of the Ni/(C, silicides) nanocapsules are improved by the doped silicides. Compared with those of Ni/C nanocapsules, the positions of maximum absorption peaks of the Ni/(C, silicides) nanocapsules exhibit large red shifts. An electric dipole model is proposed to explain this red shift phenomenon.

Highlights

  • Magnetic nanocapsules have attracted increasing attention in the area of electromagnetic wave absorption in the last decades because of their peculiar structural characteristics [1,2,3,4]

  • Wang et al have reported that changing the thickness of the graphite shell of Ni/C nanocapsules can modulate the effective permittivity. Both carbon and silicon dioxide are widely used as shell materials, in which the former has a layered structure and the latter is a good insulator [5]

  • In order to determine the surface compositions of the Ni/(C, silicides) nanocapsules, X-ray photoelectron spectroscopy (XPS) spectra were measured after etching times of 0, 10, and 20 s

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Summary

Introduction

Magnetic nanocapsules have attracted increasing attention in the area of electromagnetic wave absorption in the last decades because of their peculiar structural characteristics [1,2,3,4]. Wang et al (unpublished work) have reported that changing the thickness of the graphite shell of Ni/C nanocapsules can modulate the effective permittivity. Both carbon and silicon dioxide are widely used as shell materials, in which the former has a layered structure and the latter is a good insulator [5]. SiO2 can react with carbon at high temperatures to produce semiconducting SiC [7]

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