Microvoid formation during deformation of high‐impact polystyrene

Abstract

AbstractSmall‐angle x‐ray scattering (SAXS) has been used to study the formation of microvoids in polymers which craze or stress‐whiten extensively. Specimens are subjected to a stepwise uniaxial strain, with scattering curves being obtained at each step. The increase in scattering intensity upon crazing is attributed to the formation of microvoids, and the relative size, shape, and concentration of the scattering elements are determined by a Porod analysis of the SAXS curves. The major portion of our work has been on high‐impact polystyrene which shows a large increase in SAXS intensity as crazing occurs. We are able to follow the changes in void size and concentration during craze initiation and growth. Effects of temperature, molecular orientation, and matrix molecular weight have also been studied. The results add to the information on craze growth and microstructure known from electron microscopy and dilatometry. In addition, a qualitative physical model for microvoid nucleation is proposed, and the implications for toughness are discussed.