Abstract
Microstructures and oxygen diffusion were investigated at the LaMnO 3 film/Y 2O 3-stabilized ZrO 2 (YSZ) interface by transmission electron microscopy (TEM), atomic force microscopy (AFM) and secondary ion mass spectrometry (SIMS) analysis for samples after heat treatments and isotope oxygen exchange ( 16O/ 18O exchange) experiments. In “as-deposited LaMnO 3 film” on YSZ, the 18O-diffusion profile showed a significant decrease in 18O concentration near the LaMnO 3 film/YSZ interface, which corresponds to an amorphous layer. The heat treatment diminished the amorphous layer at the LaMnO 3 film/YSZ interface. In the heat-treated sample (1473 K for 5 h), the 18O-diffusion profile in the LaMnO 3 film showed gradual decrease and a subsequent minimum of the 18O concentration at the LaMnO 3/YSZ interface. This is due to the grain growth of lanthanum manganite, which provides the shorter paths to YSZ.
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