Abstract
La-substituted BiFeO 3, Bi 0.8La 0.2FeO 3, thin films were fabricated on Pt/Ti/SiO 2/Si substrates by pulsed laser deposition. X-ray diffraction and high-resolution transmission electron microscope were used to analyze the structures of the films. The results show the films fabricated under optimized growth condition are (0 1 2) textured. X-ray photoemission spectroscopy results indicate that the oxidation state of Fe ion is Fe 3+ in the films without detectable Fe 2+. The films show low leakage current and excellent dielectric characters. Multiferroic properties with a remnant ferroelectric polarization of 5.2 μC/cm 2 and a remanent magnetization of 0.02 μ B/Fe were established. These results have some implications for further research.
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