Abstract
Layered nickel-sulfides (Ni-S) nanocrystals had been successfully prepared by low-temperature hydrothermal approach. Rietveld X-ray diffraction (XRD) analysis revealed that these layered Ni-S materials have two different hexagonal structure phases, NiS 1.03 and NiS, both phases are NiAs-type with space group of P6 3/ mmc. X-ray energy dispersive spectra (XEDS) analysis and TEM observations also confirmed these two nanocrystals of NiS 1.03 and NiS. High-resolution transmission electron microscopy (HREM) lattice images indicated Moiré fringes with rotational or translational patterns were observed in these layered Ni-S nanophases materials. In particular, it was found that all the simulated HREM images were in good agreement with the observed HREM lattice images. Especially, the simulated selected-area electron diffraction (SAED) patterns obtained from the hexagonal Ni-S crystallographic model showed that the experimental SAED patterns taken along [11.0], [00.1] and [10.0] zone axes presented reflections produced by double diffraction effect.
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