Microstructure stability during creep deformation of hard-oriented polysynthetically twinned crystal of TiAl alloy

Abstract

The hard-orientated polysynthetically twinned (PST) crystal with the lamellar plates oriented parallel to the compression axis was deformed at 1150 K under the applied stress of 158 to 316 MPa. Microstructural changes were examined quantitatively for the PST crystal during creep deformation. In the as-grown PST crystal of the present study, proportions of α2/γ, true twin, pseudotwin, and 120 deg rotational fault interfaces were 12, 59, 12, and 17 pct, respectively. After creep deformation, lamellar coarsening by dissolution of α2 lamellae and migration of γ/γ interfaces were observed. The acceleration of creep rate after the minimum strain rate in the creep curve was attributed to the lamellar coarsening and destruction of lamellar structure during the creep deformation. Thirty-two percent of α2/γ interfaces, 51 pct of true twin interfaces, 74 pct of pseudotwin interfaces, and 80 pct of 120 deg rotational faults disappeared after 4 pct creep strain at 1150 K. The α2/γ interface was more stable than γ/γ interfaces during the creep deformation. The pseudotwin interface and 120 deg rotational fault were less thermally stable than the true twin interface for γ/γ interfaces.