Abstract
The microstructure of YBa2Cu3O7−δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO3 between the YSZ and the YBCO has been shown by cross-sectional TEM.
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