Abstract
We investigate the effect of stress-induced reorientation on the martensitic microstructure of free-standing epitaxial Ni–Mn–Ga films. Scanning electron microscopy and high-resolution transmission electron microscopy reveal that the films exhibit coexisting phases of 14 M and NM martensite after release from the MgO(1 0 0) substrate. After superplastic straining the film by 12% by applying tensile stress along a [0 0 1] direction of the Ni–Mn–Ga unit cell, the corresponding crystal structure is identified to be detwinned NM martensite.
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