Abstract
We revealed the existence of epitaxial α-Fe2O3 grains in Ba-ferrite thin films on sapphire (001) using synchrotron x-ray scattering. The antiferromagnetic α-Fe2O3 grains were formed during the crystallization of amorphous Ba-ferrite films grown on sapphire (001) by radio frequency sputtering deposition. The crystal domain size of the α-Fe2O3 grains was about 250 Å in the film plane, similar to that of the Ba-ferrite grains. The in-plane crystalline axis of the α-Fe2O3 was aligned to that of sapphire, while the Ba-ferrite film was rotated by 30° in the film plane. We confirm that the existence of these antiferromagnetic α-Fe2O3 grains greatly degraded magnetic properties of the Ba-ferrite films.
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