Abstract

The effect of sputtering pressure on the surface/interface microstructure, crystal phase, mechanical properties and electrical characteristics of nanocrystalline W-Mo films is reported. The W-Mo films (≈300 nm) with variable microstructure were deposited under variable argon (Ar) sputtering pressure (PAr), which is varied in the range of 3-19 mTorr. X-ray diffraction analyses indicate that the W-Mo films crystallize in thermodynamically stable α-phase of W. However, the crystal-quality degradation occurs for W-Mo films deposited at higher PAr due to difference in the adatom mobilities. The average grain size (d) of the W-Mo films was in the range of 11-24 nm; grain size decreases with increasing PAr. The effect of PAr and associated microstructure are significant on the mechanical characteristics; the hardness (H) and modulus of elasticity (Er) of W-Mo films deposited at lower PAr were higher but decreases continuously with increasing PAr. The W-Mo films deposited under optimum sputtering pressure exhibit superior mechanical characteristics: H=40 GPa, Er=275 GPa, H/Er=0.8, and H3/Er2=0.145 GPa, which are higher compared to pure, α-phase W-films. The W-Mo films deposited at PAr=3-9 mTorr exhibit high resistivity≈350-400 μΩ-cm, which decreases to 150-200 μΩ-cm for films deposited at higher PAr. Based on the results, structure-mechanical-electrical property correlation in W-Mo films is established.

Highlights

  • As presented and discussed in this paper, our findings demonstrate that the processing conditions can be tuned to obtain W-Mo films with variable surface and interface microstructure, which enables superior mechanical properties and enhanced electrical resistivity

  • It is well known that the thermodynamic parameters, namely the temperature and pressure during deposition, influences the growth behavior, crystal structure and grain-size variation, and surface/interface morphology evolution in thin films produced by vapor transport processes.[28,33,40,41,42]

  • Tungsten-molybdenum (W-Mo) nanocrystalline thin films (≈300 nm) were deposited under variable argon (Ar) sputtering pressure (PAr), which is varied in the range of 3-19 mTorr

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Summary

Introduction

Tungsten (W) and W-based alloys have been the subject of intense research in recent years.[1,2,3,4,5,6,7,8,9,10] W exhibit excellent physical and mechanical properties, such as high melting point, high erosion resistance, reduced long-term activation and radiation tolerance, which makes this material of particular interest for many scientific and technological applications.[3,4,5,6,7,8,9,10] W served the lighting industry (filaments) for decades because of its exceptional strength and stiffness at high temperatures, good thermal conductivity, low thermal expansion (4.43 ppm/◦C), and low resistivity (5.5 Ωcm).[9,10,11] Among the refractory metals, W is a very hard metal. Kim et al presented a new class of gamma radiation shielding materials consisting the nano-W dispersed in polymer nanocomposites

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