Abstract
Electrodeposited Co 100− x P x amorphous films with 12.8 ⩽ × ⩽ 26.5 were annealed at temperatures from 540 to 700 K. The behaviour of FMR spectra was observed in situ during crystallization. Changes in FMR spectra significantly depend on the microstructure development related to two modes of crystallization — primary and eutectic. Results are compared with the earlier electron microscope investigations.
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