Abstract
We improved the microstructure of a thin Ru underlayer for CoCrPt-SiO/sub 2/ granular-type dual-layer perpendicular media. The microstructure improvement was achieved by development of a stacked structure. In this paper, we studied the relationship between the c-axis distribution /spl Delta//spl Theta//sub 50/ of the Ru underlayer and the recording performances of media. We found that the signal-to-media-noise ratio (SNR) of media increased with decreasing the /spl Delta//spl Theta//sub 50/ of the Ru underlayer when the recording layer with same segregated fine-grain structure was prepared. The SNR for shielded pole head at 480kfci increased significantly from 12.8 to 17.2 dB when decreasing the /spl Delta//spl Theta//sub 50/ from 4.9/spl deg/ to 3.2/spl deg/.
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