Abstract

The transport properties of YBa2Cu3O7−δ thin-films are a function of their microstructure. The early stages of film nucleation and growth will influence the final film microstructure and therefore the properties. It is important to determine the nature of film growth and the influence of the substrate on the establishment of epitaxy. Films have been shown to grow with highly oriented microstructures even on substrates with poorly matched lattice parameters. By utilizing a novel specimen preparation technique, direct observation by transmission electron microscopy of the early stages of film growth is possible.

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